PSI 400/ 410 Quick Position Manual Wafer Probe Station 量測6”~8”晶圓，高精確度，推拉式容易操作，可使用單手操作定位。PSI 400平台Z軸具有3個定位點， PSI 410 顯微鏡Z軸具有12個定位點。

PSI 2020HV™ HORIZONTAL/VIRTICAL SIGNAL INTEGRITY TDR PROBE STATION MULTIPLE CIRCUIT BOARD CONFIGURATIONS 適用高速印刷電路板進行電性量測或時域測試(Time Domain Testing)。量測平台可調整為水平或垂直位置，可搭配兩具攝影機。顯微鏡放大倍率為2.1X to 270X。 PSI 2020HV可與Tektronix 11800、SDZOTDR、TDS 8000、80E04TD及Agilent 54750 or 83480相容。如需其他規格請聯絡本公司

PRODUCT NAME: P210/360VM, LEFT HAND For probing 10 micron geometries, 0.4” (10.0mm) maximum travel per axis, 32 TPI lead screw, mini-arc manipulator, standard vacuum base for use with PSI 400 and 410 stations. If you can not find what you need, Please contact us for more information.

Straight Tips
Cat whisker Tips
Bend Tips
Double bend Tips
Spring probe Tips
RF/Microwave Tips
Tungsten Tip sizes between 0.1um to 10um.
Plated Gold or special metals Special materials (beryllium cooper, nickel, etc.) available.