PSI 400/ 410 Quick Position Manual Wafer Probe Station 量测6”~8”晶圆，高精确度，推拉式容易操作，可使用单手操作定位。PSI 400平台Z轴具有3个定位点， PSI 410 显微镜Z轴具有12个定位点。

PSI 2020HV™ HORIZONTAL/VIRTICAL SIGNAL INTEGRITY TDR PROBE STATION MULTIPLE CIRCUIT BOARD CONFIGURATIONS 适用高速印刷电路板进行电性量测或时域测试(Time Domain Testing)。量测平台可调整为水平或垂直位置，可搭配两具摄影机。显微镜放大倍率为2.1X to 270X。 PSI 2020HV可与Tektronix 11800、SDZOTDR、TDS 8000、80E04TD及Agilent 54750 or 83480相容。如需其他规格请联络本公司

PRODUCT NAME: P210/360VM, LEFT HAND For probing 10 micron geometries, 0.4” (10.0mm) maximum travel per axis, 32 TPI lead screw, mini-arc manipulator, standard vacuum base for use with PSI 400 and 410 stations. If you can not find what you need, Please contact us for more information.

Straight Tips
Cat whisker Tips
Bend Tips
Double bend Tips
Spring probe Tips
RF/Microwave Tips
Tungsten Tip sizes between 0.1um to 10um.
Plated Gold or special metals Special materials (beryllium cooper, nickel, etc.) available.