商品介紹

PSI 600LS Manual 300mm WAT Probe Station

PSI 600LS Manual 300mm Wafer Probe Station 適用12 吋之晶圓WAT 應用,具有低漏電流(fA)及高精密度( 0.1μm)。量測搭配精密馬達驅動X-Y Stage解析度為 0.1um。可搭配溫度控制、或特殊Wager Chuck。顯微鏡使用精密光學顯微鏡,同時具有延長顯微鏡壽命設計。

 

PSI S500 SEMI-AUTOMATIC PROBE STATION

PSI S500 SEMI-AUTOMATIC PROBE STATION 操作容易的半自動探針台,可同時放置10組以上探針座進行量測使用Pendant (keypad)或Joystick操作,可透過RS232介面傳輸指令。採用固定量測平面設計,顯微鏡在水平X與Y軸方向各可移動2”。 顯微鏡使用USMCO精密光學顯微鏡。可配合National Instruments的Labview™軟體或Alliance Technology的Metrics ICS™進行量測。

 

PSI 400/ 410 Quick Position Manual Probe Station

PSI 400/ 410 Quick Position Manual Wafer Probe Station 量測6”~8”晶圓,高精確度,推拉式容易操作,可使用單手操作定位。PSI 400平台Z軸具有3個定位點, PSI 410 顯微鏡Z軸具有12個定位點。

 

PSI 404LS / 414LS

PSI 404LS / 414LS 4” x 4” X-Y Focus Precision Lead Screw Probe Station 量測6”~8”晶圓,高精確度採用固定量測平面設計,顯微鏡在水平X與Y軸方向各可移動4”,晶圓承載平台位置可移動6”~8”,可用雙手同時調整,容易精確定位。PSI 404平台Z軸具有3個定位點, PSI 414 顯微鏡Z軸具有12個定位點。提供範圍廣泛的各種測試應用且同時提供功能強大, 品質穩定的優勢。

 

P2525M MANIPULATORS

PRODUCT NAME: P2525M-VM For probing sub-micron geometries, 0.5” (12.7mm) travel per axis, 200 TPI, standard base for use with PSI 400 and 410 stations, either left or right side of station, features fast Z lift. Vacuum.

 

PSI 400LS / 410LS Precision Lead Screw Positioning

PSI 400LS / 410LS Precision Lead Screw Positioning Probe Station 量測6”~8”晶圓,高精確度,推拉式容易操作,可使用單手操作定位。PSI 400LS平台Z軸具有3個定位點, PSI 410 LS顯微鏡Z軸具有12個定位點。

 

PSI 2020HV™ 電路板訊號完整性測試探針台

PSI 2020HV™ HORIZONTAL/VIRTICAL SIGNAL INTEGRITY TDR PROBE STATION MULTIPLE CIRCUIT BOARD CONFIGURATIONS 適用高速印刷電路板進行電性量測或時域測試(Time Domain Testing)。量測平台可調整為水平或垂直位置,可搭配兩具攝影機。顯微鏡放大倍率為2.1X to 270X。 PSI 2020HV可與Tektronix 11800、SDZOTDR、TDS 8000、80E04TD及Agilent 54750 or 83480相容。如需其他規格請聯絡本公司

 

BGA PCB 探針台

PSI 1120™ BGA COMPACT GENERAL PURPOSE PROBE STATION 運用於適用BGA、平面顯示器(flat panel displays)或高密度印刷電路板(high density populated PCB)電性或信號完整性(Signal Integrity) 量測,適用於各種高速資料傳輸電路設計測試應用。

Probe tips探針

Straight Tips
Cat whisker Tips
Bend Tips
Double bend Tips
Spring probe Tips
RF/Microwave Tips
Tungsten Tip sizes between 0.1um to 10um.
Plated Gold or special metals Special materials (beryllium cooper, nickel, etc.) available.

Probe Holders

These general-purpose probe holders offer three versions with two different holder tube configurations.

Bent tube at 45 degree angle with either a 45 degree probe tip exit secured by a setscrew or probe tip exit at end (on axis) secured by a set screw on the side.

The third is a straight tube with a probe tip exit at end (on axis) secured with a setscrew on the side.

Specification:
· Tube and tip assembly, 300 series stainless steel
· 22ga. silver plated stranded copper wire with black PTFE insulation
· Standard tested assembly resistance > 0.2 ohms @ 70 degree F
 · Temperature range of probing to 400 degree C · BNC connector, 2 lug male, 50 ohm
 · Accepts Model 7 replaceable probe tips, see probe guide for more information

 

Manipulators探針座

PRODUCT NAME: P210/360VM, LEFT HAND For probing 10 micron geometries, 0.4” (10.0mm) maximum travel per axis, 32 TPI lead screw, mini-arc manipulator, standard vacuum base for use with PSI 400 and 410 stations. If you can not find what you need, Please contact us for more information.

 

P45探針座

PRODUCT NAME: P45, LEFT HAND Left Hand Articulating Arm, 24 TPI (threads per inch), for probing non linear axis 5-10 micron geometries vacuum base