探針量測系統


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Jandel Probe heads

Jandel Cartridge Probe Heads for CDE ResMap system or other 4PP systems auch as 4 Dimensions, KLA-Tencor/Prometrix, and so on. 


供應Jandel 探頭,適合4D, KLA, CDE等量測設備有多種規格請洽本公司


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Probe head for 4 ponit probe

Jandel原廠四點探針頭 4 point probe heads,適用各大廠牌阻值量測系統,依據量測需求有多種規格 Type A,Type B,Type C,Type D 歡迎與我們連絡







Miniature Cartridge (Napson) 

With top retaining screw and positioning key. Plastic housing.


 
 



Miniature Cartridge (AIT) 

With 6-32 screw holes. Plastic housing.


 
 



Cylindrical

25.4mm diameter x 48.5mm high.


 
 



Cartridge with 6-way Connector Socket (KLA Prometrix)

25.4mm diameter x 41mm high.


 
 



Cartridge with 6-way Connector Socket (CDE ResMap)

With black nosepiece and 1.5mm needle projection.


 
 



Macor Glass-Ceramic High/Low Temperature 

With ceramic fibre leads.


 
 



Cartridge with lead 

25.4mm diameter x 40.5mm high.


 
 



Cartridge with 4 Pin Connector 

25.4 diameter 40.5mm high.


 
 



Cylinidrical Hall / Resistivity 

25.4mm diameter x 18.5mm high.




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四點探針阻值量測儀

科宇系統提供四點探針量測相關設備與探頭耗材





Features:


  • Automated Sheet Resistivity Meter

  • 1 mOhm / square to 800 kOhm / square

  • extended range up to 8x1011W/sq

  • temperature compensation option

  • up to to 8" wafer capability or 156mm x 156mm

  • stand alone systems and PC controlled systems with Automap software package



Model 333A Four-Point Probe for 300mm
Features:

  • Automated Sheet Resistivity Meter

  • 1 mOhm / square to 800 kOhm / square

  • extended range up to 8x1011W/sq

  • up to to 12" wafer capability

  • Automap software package

  • SECS-II communication available

  • Automatic probe-head switching available