4D 4PP RS Meter
https://4dimensions.com/four-point-probes
Click here 
欢迎洽询相关机型及规格!
FOUR DIMENSIONS INC. is located in California and has manufactured advanced semiconductor probing systems since 1978. We provide Four-Point Probes with an extended measurement range for sophisticated probing of compound semiconductor wafers.
280PI/280SI 4PP Station for 200mm or 156mm x 156mm Features
- Semi-Auto Sheet Resistivity Meter
- Measurement Range 1m W/sq to 800K W/sq
- extended range up to 8E11 W/sq
- temperature compensation option
- up to to 8" wafer capability or 156mm x 156mm
- stand alone systems and PC controlled systems with Automap software package
Model 233AC/ 233AS / 333AC / 333AF 4PP Station for 200mm/300mm Features:
- Fully Automated Cassette to Cassette System with SMIF/FOUP option
- Sheet Resistance Measurement Range 1m W/sq to 800K W/sq
- extended range up to 8E11 W/sq
- up to to 8"/12" wafer capability
- Automap software package
- SECS-II communication available
- Automatic probe-head switching available
Jandel - Four-Point-Probe Heads
https://www.jandel.co.uk/product_categories/four-point-probes/
Click here
Jandel Engineering Ltd. 成立於1967年(具备超过50年以上的专业经验), 是英国专门制造四点探针头的厂商，各大厂牌阻值量测系统，例如: KLA-Tencor/Prometrix、CDE ResMap、4D、Napson等，已广泛使用於国内代工、记忆体、封测及面板厂等客户，依据量测需求有多种规格可以选择，欢迎洽询。
Cartridge probe with 6-way connector (KLA/Tencor)
Cartridge probe with 6-way connector (CDE)
Cylindrical four point probe head
Micro Point Pro (MPP) - Four-Point-Probe Heads
https://mpptools.com/4-points-probes/
Click here
Micro Point Pro (MPP)成立於 2010 年，收购了 Kulick & Sofa 四点探针头及后端工具生产线，同时一并吸收了该生产线拥有超过 40 年专业知识和经验丰富的员工。4PP探头全在以色列制造、组装、并通过内部严谨的品质检验。其4PP探头OEM客户有：KLA-Tencor、Napson 、Kokusai, etc，尚有各式四点探针针头可供选购或客制。
MPP is a world renowned, leading manufacturer of Four Point Probe (4PP) heads for resistivity measurements of wafers and thin conductive films.
MPP’s 4PP are commonly used in applications such as:
▪ Resistivity measurement of silicon wafers
▪ 4-point measurement of epitaxial, ion-implanted and defused layers
▪ 4-point measurement of metallic and other thin films
MPP’s Probe Head Features and Advantages:
▪ Tungsten Carbide needles with low friction Ruby guides
▪ A wide range of probe tip radii and needle spacings
▪ Individual needle pressure adjustment
▪ Variety of probe head designs : Fell, Cylindrical, others..
▪ Option for customization
▪ Refurbishment program available
MPP’s probe heads are being used across the globe on the most well-known wafer resistivity measuring equipment such as KLA, Kokusai, Napson and other systems.
MPP is a world renowned, leading manufacturer of Four Point Probe (4PP) heads for resistivity measurements of wafers and thin conductive films.
MPP’s 4PP are commonly used in applications such as:
▪ Resistivity measurement of silicon wafers
▪ 4-point measurement of epitaxial, ion-implanted and defused layers
▪ 4-point measurement of metallic and other thin films
MPP’s Probe Head Features and Advantages:
▪ Tungsten Carbide needles with low friction Ruby guides
▪ A wide range of probe tip radii and needle spacings
▪ Individual needle pressure adjustment
▪ Variety of probe head designs : Fell, Cylindrical, others..
▪ Option for customization
▪ Refurbishment program available
MPP’s probe heads are being used across the globe on the most well-known wafer resistivity measuring equipment such as KLA, Kokusai, Napson and other systems.
