科宇系統有限公司

歡迎洽詢相關機型及規格!

FOUR DIMENSIONS INC. is located in California and has manufactured advanced semiconductor probing systems since 1978. We provide Four-Point Probes with an extended measurement range for sophisticated probing of compound semiconductor wafers. 


 280PI/280SI 4PP Station for 200mm or 156mm x 156mm Features

• Semi-Auto Sheet Resistivity Meter
• Measurement Range 1m W/sq to 800K W/sq
• extended range up to 8E11 W/sq
• temperature compensation option
• up to to 8" wafer capability or 156mm x 156mm
• stand alone systems and PC controlled systems with Automap software package

Model 233AC/ 233AS / 333AC / 333AF 4PP Station for 200mm/300mm Features:

• Fully Automated Cassette to Cassette System with SMIF/FOUP option
• Sheet Resistance Measurement Range 1m W/sq to 800K W/sq
• extended range up to 8E11 W/sq
• up to to 8"/12" wafer capability
• Automap software package
• SECS-II communication available
• Automatic probe-head switching available